F. Camerik

	1991
2		Eric Bruls, F. Camerik, H. J. Kretschman, Jochen A. G. Jess: A Generic Method to Develop a Defect Monitoring System for IC Processes. ITC 1991: 218-227
	1989
1		F. Camerik, P. A. J. Dirks, Jochen A. G. Jess: Qualification and Quantification of Process-Induced Product-Related Defects. ITC 1989: 643-652

Coauthor Index

1	Eric Bruls (E. M. J. G. Bruls)	[2]
2	P. A. J. Dirks	[1]
3	Jochen A. G. Jess	[1] [2]
4	H. J. Kretschman	[2]

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