![]() | ![]() |
| 2005 | ||
|---|---|---|
| 1 | K. Yacine, F. Flourens, D. Bourrier, L. Salvagnac, P. Calmont, X. Lafontan, Q.-H. Duong, Lionel Buchaillot, D. Peyrou, Patrick Pons: Biaxial initial stress characterization of bilayer gold RF-switches. Microelectronics Reliability 45(9-11): 1776-1781 (2005) | |
| 1 | D. Bourrier | [1] |
| 2 | Lionel Buchaillot | [1] |
| 3 | Q.-H. Duong | [1] |
| 4 | F. Flourens | [1] |
| 5 | X. Lafontan | [1] |
| 6 | D. Peyrou | [1] |
| 7 | Patrick Pons | [1] |
| 8 | L. Salvagnac | [1] |
| 9 | K. Yacine | [1] |
Data released under the ODC-BY 1.0 license — See also our legal information page