Pat Callis

	2003
1		Tim Menzies, Justin S. Di Stefano, Kareem Ammar, Kenneth McGill, Pat Callis, Robert (Mike) Chapman, John Davis: When Can We Test Less? IEEE METRICS 2003: 98-

Coauthor Index

1	Kareem Ammar	[1]
2	Robert (Mike) Chapman	[1]
3	John Davis	[1]
4	Kenneth McGill	[1]
5	Tim Menzies	[1]
6	Justin S. Di Stefano	[1]

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