Th. Calin

	2000
4		Michael Nicolaidis, N. Zaidan, Th. Calin, D. Bied-Charreton: ISIS: A Fail-Safe Interface Realized in Smart Power Technology. IOLTW 2000: 191-
	1999
3		Th. Calin, Lorena Anghel, Michael Nicolaidis: Built-In Current Sensor for IDDQ Testing in Deep Submicron CMOS. VTS 1999: 135-142
	1998
2		Jaime Velasco-Medina, Th. Calin, Michael Nicolaidis: Fault Detection for Linear Analog Circuits Using Current Injection. DATE 1998: 987-988
	1995
1		Th. Calin, F. L. Vargas, Michael Nicolaidis: Upset-Tolerant CMOS SRAM Using Current Monitoring: Prototype and Test Experiments. ITC 1995: 45-53

Coauthor Index

1	Lorena Anghel	[3]
2	D. Bied-Charreton	[4]
3	Michael Nicolaidis	[1] [2] [3] [4]
4	F. L. Vargas	[1]
5	Jaime Velasco-Medina	[2]
6	N. Zaidan	[4]

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