dblp.uni-trier.dewww.dagstuhl.dewww.uni-trier.de

Bing-Chu Cai Coauthor index pubzone.org

List of publications from the DBLP Bibliography Server - FAQ
Ask others: ACM DL/Guide - CiteSeerX - CSB - MetaPress - Google - Bing - Yahoo

DBLP keys2008
6Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJing-Quan Liu, Hua-Bin Fang, Zheng-Yi Xu, Xin-Hui Mao, Xiu-Cheng Shen, Di Chen, Hang Liao, Bing-Chu Cai: A MEMS-based piezoelectric power generator array for vibration energy harvesting. Microelectronics Journal 39(5): 802-806 (2008)
2006
5Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLHua-Bin Fang, Jing-Quan Liu, Zheng-Yi Xu, Lu Dong, Li Wang, Di Chen, Bing-Chu Cai, Yue Liu: Fabrication and performance of MEMS-based piezoelectric power generator for vibration energy harvesting. Microelectronics Journal 37(11): 1280-1284 (2006)
2005
4Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLXi-Ning Wang, Xiao-Lin Zhao, Yong Zhou, Xu-Han Dai, Bing-Chu Cai: Fabrication and performance of novel RF spiral inductors on silicon. Microelectronics Journal 36(8): 737-740 (2005)
2004
3Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLSummer F. C. Tseng, Wei-Ting Kary Chien, Excimer Gong, Willings Wang, Bing-Chu Cai: Some practical considerations for effective and efficient wafer-level reliability control. Microelectronics Reliability 44(8): 1233-1243 (2004)
2003
2Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLSummer Fan-Chung Tseng, Wei-Ting Kary Chien, Excimer Gong, Bing-Chu Cai: A cost-effective wafer-level reliability test system for integrated circuit makers. IEEE T. Instrumentation and Measurement 52(5): 1458-1467 (2003)
1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLSummer F. C. Tseng, Wei-Ting Kary Chien, Bing-Chu Cai: Improvement of poly-silicon hole induced gate oxide failure by silicon rich oxidation. Microelectronics Reliability 43(5): 713-724 (2003)

Coauthor Index

1Di Chen [5] [6]
2Wei-Ting Kary Chien [1] [2] [3]
3Xu-Han Dai [4]
4Lu Dong [5]
5Hua-Bin Fang [5] [6]
6Excimer Gong [2] [3]
7Hang Liao [6]
8Jing-Quan Liu [5] [6]
9Yue Liu [5]
10Xin-Hui Mao [6]
11Xiu-Cheng Shen [6]
12Summer F. C. Tseng (Summer Fan-Chung Tseng) [1] [2] [3]
13Li Wang [5]
14Willings Wang [3]
15Xi-Ning Wang [4]
16Zheng-Yi Xu [5] [6]
17Xiao-Lin Zhao [4]
18Yong Zhou [4]

Colors in the list of coauthors

Last update Sun May 27 04:04:01 2012 CET by the DBLP TeamThis material is Open Data Data released under the ODC-BY 1.0 license — See also our legal information page