R. Cagliesi

	2009
2		Davide Appello, Paolo Bernardi, R. Cagliesi, M. Giancarlini, Michelangelo Grosso, Edgar E. Sánchez, Matteo Sonza Reorda: Automatic Functional Stress Pattern Generation for SoC Reliability Characterization. European Test Symposium 2009: 93-98
	2008
1		Davide Appello, Paolo Bernardi, R. Cagliesi, M. Giancarlini, Michelangelo Grosso: An Innovative and Low-Cost Industrial Flow for Reliability Characterization of SoCs. European Test Symposium 2008: 140-145

Coauthor Index

1	Davide Appello	[1] [2]
2	Paolo Bernardi	[1] [2]
3	M. Giancarlini	[1] [2]
4	Michelangelo Grosso	[1] [2]
5	Matteo Sonza Reorda	[2]
6	Ernesto Sánchez (Edgar E. Sánchez, Edgar Ernesto Sánchez Sánchez)	[2]

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