 | 2010 |
|---|
| 7 |       | Giovanni Crupi,
Dominique M. M.-P. Schreurs,
Alina Caddemi:
Accurate silicon dummy structure model for nonlinear microwave FinFET modeling.
Microelectronics Journal 41(9): 574-578 (2010) |
| 2006 |
|---|
| 6 | | Alina Caddemi,
Giovanni Crupi,
Nicola Donato:
Microwave characterization and modeling of packaged HEMTs by a direct extraction procedure down to 30 K.
IEEE T. Instrumentation and Measurement 55(2): 465-470 (2006) |
| 5 | | Alina Caddemi,
Giovanni Crupi,
N. Donato:
Temperature effects on DC and small signal RF performance of AlGaAs/GaAs HEMTs.
Microelectronics Reliability 46(1): 169-173 (2006) |
| 2005 |
|---|
| 4 | | M. Alvaro,
Alina Caddemi,
Giovanni Crupi,
N. Donato:
Temperature and bias investigation of self heating effect and threshold voltage shift in pHEMT's.
Microelectronics Journal 36(8): 732-736 (2005) |
| 2004 |
|---|
| 3 | | Alina Caddemi,
Giovanni Crupi,
N. Donato:
A robust and fast procedure for the determination of the small signal equivalent circuit of HEMTs.
Microelectronics Journal 35(5): 431-436 (2004) |
| 2003 |
|---|
| 2 | | Alina Caddemi,
Nicola Donato:
Characterization techniques for temperature-dependent experimental analysis of microwave transistors.
IEEE T. Instrumentation and Measurement 52(1): 85-91 (2003) |
| 2002 |
|---|
| 1 | | Alina Caddemi,
N. Donato:
Temperature-dependent noise characterization and modeling of on-wafer microwave transistors.
Microelectronics Reliability 42(3): 361-366 (2002) |
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