F. Cacchione

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2005

1 F. Cacchione, A. Corigliano, B. De Masi, C. Riva: Out of plane vs in plane flexural behaviour of thin polysilicon films: Mechanical characterization and application of the Weibull approach. Microelectronics Reliability 45(9-11): 1758-1763 (2005)

	2005
1		F. Cacchione, A. Corigliano, B. De Masi, C. Riva: Out of plane vs in plane flexural behaviour of thin polysilicon films: Mechanical characterization and application of the Weibull approach. Microelectronics Reliability 45(9-11): 1758-1763 (2005)

Coauthor Index

1 A. Corigliano [1]

2 B. De Masi [1]

3 C. Riva [1]

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