 | 2010 |
| 11 |  | Yaima Filiberto,
Yaile Caballero,
Rafael Larrua,
Rafael Bello:
A method to build similarity relations into extended Rough Set Theory.
ISDA 2010: 1314-1319 |
| 10 |  | Yaima Filiberto,
Rafael Bello,
Yaile Caballero,
Rafael Larrua:
Using PSO and RST to Predict the Resistant Capacity of Connections in Composite Structures.
NICSO 2010: 359-370 |
| 9 |  | Yaile Caballero,
Rafael Bello,
Leticia Arco,
María M. García,
Enislay Ramentol:
Knowledge Discovery Using Rough Set Theory.
Advances in Machine Learning I 2010: 367-383 |
| 2007 |
| 8 |  | Yaile Caballero,
Leticia Arco,
Rafael Bello,
Jorge Marx Gómez:
New Measures for Evaluating Decision Systems Using Rough Set Theory: The Application in Seasonal Weather Forecasting.
ITEE 2007: 161-173 |
| 7 |  | Beitmantt Cárdenas,
Yaile Caballero,
Rafael Bello:
La Teoría de los Conjuntos Aproximados y las técnicas de Boostrap para la Edición de Conjuntos de Entrenamiento. Su aplicación en el pronóstico metereológico.
RASI 4(3): 165-170 (2007) |
| 2006 |
| 6 |  | Yaile Caballero,
Rafael Bello,
Delia Alvarez,
María M. García:
Two new feature selection algorithms with Rough Sets Theory.
IFIP AI 2006: 209-216 |
| 5 |  | Yaile Caballero,
Rafael Bello,
Delia Alvarez,
María M. García,
Yaimara Pizano:
Improving the k-NN method: Rough Set in edit training set.
IFIP PPAI 2006: 21-30 |
| 4 |  | Yaile Caballero,
Rafael Bello,
Alberto Taboada,
Ann Nowé,
María M. García,
Gladys Casas:
A New Measure Based in the Rough Set Theory to Estimate the Training Set Quality.
SYNASC 2006: 133-140 |
| 2005 |
| 3 |  | Rafael Bello,
Ann Nowé,
Yaile Caballero,
Yudel Gómez,
Peter Vrancx:
A model based on ant colony system and rough set theory to feature selection.
GECCO 2005: 275-276 |
| 2 |  | Yaile Caballero,
Simone Joseph,
Yuniesky Lezcano,
Rafael Bello,
María M. García,
Yaimara Pizano:
Using rough sets to edit training set in k-NN method.
ISDA 2005: 456-463 |
| 2003 |
| 1 |  | Pedro Y. Piñero,
Leticia Arco,
María M. García,
Yaile Caballero,
Raykenler Yzquierdo,
Alfredo Morales:
Two New Metrics for Feature Selection in Pattern Recognition.
CIARP 2003: 488-497 |