Rod Byrne

	1995
3		Shujian Zhang, Rod Byrne, Jon C. Muzio, D. Michael Miller: Quantitative analysis for linear hybrid cellular automata and LFSR as built-in self-test generators for sequential faults. J. Electronic Testing 7(3): 209-221 (1995)
	1994
2		Shujian Zhang, Rod Byrne, Jon C. Muzio, D. Michael Miller: Why Cellular Automata are better than LFSRs as Built-in Self-test Generators for Sequential-type Faults. ISCAS 1994: 69-72
	1992
1		Shujian Zhang, Rod Byrne, D. Michael Miller: BIST Generators for Sequential Faults. ICCD 1992: 260-263

Coauthor Index

1	D. Michael Miller	[1] [2] [3]
2	Jon C. Muzio	[2] [3]
3	Shujian Zhang	[1] [2] [3]

Last update Sun May 27 04:04:01 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page