Sergey Bychikhin

Scrgey Bychikhin

	2011
13		Dionyz Pogany, Sergey Bychikhin, Michael Heer, W. Mamanee, Erich Gornik: Application of transient interferometric mapping method for ESD and latch-up analysis. Microelectronics Reliability 51(9-11): 1592-1596 (2011)
	2010
12		Sergey Bychikhin, G. Haberfehlner, J. Rhayem, D. Vanderstraeten, R. Gillon, Dionyz Pogany: Investigation of smart power DMOS devices under repetitive stress conditions using transient thermal mapping and numerical simulation. Microelectronics Reliability 50(9-11): 1427-1430 (2010)
	2009
11		G. Haberfehlner, Sergey Bychikhin, V. Dubec, Michael Heer, A. Podgaynaya, M. Pfost, Matthias Stecher, Erich Gornik, Dionyz Pogany: Thermal imaging of smart power DMOS transistors in the thermally unstable regime using a compact transient interferometric mapping system. Microelectronics Reliability 49(9-11): 1346-1351 (2009)
	2007
10		Michael Heer, Sergey Bychikhin, W. Mamanee, Dionyz Pogany, A. Heid, P. Grombach, M. Klaussner, W. Soppa, B. Ramler: Experimental and numerical analysis of current flow homogeneity in low voltage SOI multi-finger gg-NMOS and NPN ESD protection devices. Microelectronics Reliability 47(9-11): 1450-1455 (2007)
9		V. Dubec, Sergey Bychikhin, Dionyz Pogany, Erich Gornik, Tilo Brodbeck, Wolfgang Stadler: Backside interferometric methods for localization of ESD-induced leakage current and metal shorts. Microelectronics Reliability 47(9-11): 1539-1544 (2007)
8		Sergey Bychikhin, T. Swietlik, T. Suski, S. Porowski, P. Perlin, Dionyz Pogany: Thermal analysis of InGaN/GaN (GaN substrate) laser diodes using transient interferometric mapping. Microelectronics Reliability 47(9-11): 1649-1652 (2007)
	2006
7		Michael Heer, V. Dubec, Sergey Bychikhin, Dionyz Pogany, Erich Gornik, M. Frank, A. Konrad, J. Schulz: Analysis of triggering behaviour of high voltage CMOS LDMOS clamps and SCRs during ESD induced latch-up. Microelectronics Reliability 46(9-11): 1591-1596 (2006)
	2005
6		Martin Litzenberger, Christoph Furböck, Sergey Bychikhin, Dionyz Pogany, Erich Gornik: Scanning heterodyne interferometer setup for the time-resolved thermal and free-carrier mapping in semiconductor devices. IEEE T. Instrumentation and Measurement 54(6): 2438-2445 (2005)
5		Michael Heer, V. Dubec, M. Blaho, Sergey Bychikhin, Dionyz Pogany, Erich Gornik, M. Denison, Matthias Stecher, G. Groos: Automated setup for thermal imaging and electrical degradation study of power DMOS devices. Microelectronics Reliability 45(9-11): 1688-1693 (2005)
	2003
4		V. Dubec, Sergey Bychikhin, M. Blaho, Dionyz Pogany, Erich Gornik, J. Willemen, N. Qu, Wolfgang Wilkening, L. Zullino, A. Andreini: A dual-beam Michelson interferometer for investigation of trigger dynamics in ESD protection devices under very fast TLP stress. Microelectronics Reliability 43(9-11): 1557-1561 (2003)
	2002
3		Dionyz Pogany, J. Kuzmik, J. Darmo, Martin Litzenberger, Sergey Bychikhin, Karl Unterrainer, Z. Mozolova, S. Hascik, Tibor Lalinsky, Erich Gornik: Electrical field mapping in InGaP HEMTs and GaAs terahertz emitters using backside infrared OBIC technique. Microelectronics Reliability 42(9-11): 1673-1677 (2002)
	2001
2		Martin Litzenberger, R. Pichler, Sergey Bychikhin, Dionyz Pogany, Erich Gornik, Kai Esmark, Harald Gossner: Effect of pulse risetime on trigger homogeneity in single finger grounded gate nMOSFET electrostatic discharge protection devices. Microelectronics Reliability 41(9-10): 1385-1390 (2001)
1		Sergey Bychikhin, Martin Litzenberger, R. Pichler, Dionyz Pogany, Erich Gornik, G. Groos, Matthias Stecher: Thermal and free carrier laser interferometric mapping and failure analysis of anti-serial smart power ESD protection structures. Microelectronics Reliability 41(9-10): 1501-1506 (2001)

Coauthor Index

1	A. Andreini	[4]
2	M. Blaho	[4] [5]
3	Tilo Brodbeck	[9]
4	J. Darmo	[3]
5	M. Denison	[5]
6	V. Dubec	[4] [5] [7] [9] [11]
7	Kai Esmark	[2]
8	M. Frank	[7]
9	Christoph Furböck	[6]
10	R. Gillon	[12]
11	Erich Gornik	[1] [2] [3] [4] [5] [6] [7] [9] [11] [13]
12	Harald Gossner	[2]
13	P. Grombach	[10]
14	G. Groos	[1] [5]
15	G. Haberfehlner	[11] [12]
16	S. Hascik	[3]
17	Michael Heer	[5] [7] [10] [11] [13]
18	A. Heid	[10]
19	M. Klaussner	[10]
20	A. Konrad	[7]
21	J. Kuzmik	[3]
22	Tibor Lalinsky	[3]
23	Martin Litzenberger	[1] [2] [3] [6]
24	W. Mamanee	[10] [13]
25	Z. Mozolova	[3]
26	P. Perlin	[8]
27	M. Pfost	[11]
28	R. Pichler	[1] [2]
29	A. Podgaynaya	[11]
30	Dionyz Pogany	[1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [13]
31	S. Porowski	[8]
32	N. Qu	[4]
33	B. Ramler	[10]
34	J. Rhayem	[12]
35	J. Schulz	[7]
36	W. Soppa	[10]
37	Wolfgang Stadler	[9]
38	Matthias Stecher	[1] [5] [11]
39	T. Suski	[8]
40	T. Swietlik	[8]
41	Karl Unterrainer	[3]
42	D. Vanderstraeten	[12]
43	Wolfgang Wilkening	[4]
44	J. Willemen	[4]
45	L. Zullino	[4]

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