Kenneth M. Butler

	2011
42		Kapil R. Gotkhindikar, W. Robert Daasch, Kenneth M. Butler, John M. Carulli Jr., Amit Nahar: Die-level adaptive test: Real-time test reordering and elimination. ITC 2011: 1-10
41		Ender Yilmaz, Sule Ozev, Kenneth M. Butler: Adaptive multidimensional outlier analysis for analog and mixed signal circuits. ITC 2011: 1-8
40		Hsiu-Ming Chang, Kwang-Ting Cheng, Wangyang Zhang, Xin Li, Kenneth M. Butler: Test cost reduction through performance prediction using virtual probe. ITC 2011: 1-9
	2010
39		Erik Jan Marinissen, Adit Singh, Dan Glotter, Marco Esposito, John M. Carulli Jr., Amit Nahar, Kenneth M. Butler, Davide Appello, Chris Portelli: Adapting to adaptive testing. DATE 2010: 556-561
38		Ender Yilmaz, Sule Ozev, Kenneth M. Butler: Adaptive test flow for mixed-signal/RF circuits using learned information from device under test. ITC 2010: 674-683
37		Mohammad Tehranipoor, Kenneth M. Butler: Power Supply Noise: A Survey on Effects and Research. IEEE Design & Test of Computers 27(2): 51-67 (2010)
	2009
36		Amit Nahar, Kenneth M. Butler, John M. Carulli Jr., Charles Weinberger: Quality improvement and cost reduction using statistical outlier methods. ICCD 2009: 64-69
35		Kenneth M. Butler, John M. Carulli Jr., Jayashree Saxena, Amit Nahar, W. Robert Daasch: Multidimensional Test Escape Rate Modeling. IEEE Design & Test of Computers 26(5): 74-82 (2009)
	2008
34		Kenneth M. Butler, John M. Carulli Jr., Jayashree Saxena: Modeling Test Escape Rate as a Function of Multiple Coverages. ITC 2008: 1-9
	2007
33		Mohammad Tehranipoor, Kenneth M. Butler: Guest Editors' Introduction: IR Drop in Very Deep-Submicron Designs. IEEE Design & Test of Computers 24(3): 214-215 (2007)
32		Nisar Ahmed, Mohammad Tehranipoor, C. P. Ravikumar, Kenneth M. Butler: Local At-Speed Scan Enable Generation for Transition Fault Testing Using Low-Cost Testers. IEEE Trans. on CAD of Integrated Circuits and Systems 26(5): 896-906 (2007)
	2006
31		Kenneth M. Butler: Guest Editor's Introduction: ITC Helps Get More Out of Test. IEEE Design & Test of Computers 23(5): 388-389 (2006)
	2004
30		Kenneth M. Butler: Sure You Can Get to 100 DPPM in Deep Submicron, But It'll Cost Ya. ITC 2004: 1419
29		Kenneth M. Butler, Jayashree Saxena, Tony Fryars, Graham Hetherington: Minimizing Power Consumption in Scan Testing: Pattern Generation and DFT Techniques. ITC 2004: 355-364
	2003
28		Jayashree Saxena, Kenneth M. Butler, Vinay B. Jayaram, Subhendu Kundu, N. V. Arvind, Pravin Sreeprakash, Manfred Hachinger: A Case Study of IR-Drop in Structured At-Speed Testing. ITC 2003: 1098-1104
27		Kenneth M. Butler, Kwang-Ting (Tim) Cheng, Li-C. Wang: Guest Editors' Introduction: Speed Test and Speed Binning for Complex ICs. IEEE Design & Test of Computers 20(5): 6-7 (2003)
	2002
26		Jayashree Saxena, Kenneth M. Butler, John Gatt, R. Raghuraman, Sudheendra Phani Kumar, Supatra Basu, David J. Campbell, John Berech: Scan-Based Transition Fault Testing - Implementation and Low Cost Test Challenges . ITC 2002: 1120-1129
25		Kenneth M. Butler: Is ITC Bored with Board Test? ITC 2002: 1237
24		Hari Balachandran, Kenneth M. Butler, Neil Simpson: Facilitating Rapid First Silicon Debug. ITC 2002: 628-637
	2001
23		Frank F. Hsu, Kenneth M. Butler, Janak H. Patel: A case study on the implementation of the Illinois Scan Architecture. ITC 2001: 538-547
22		Jayashree Saxena, Kenneth M. Butler, Lee Whetsel: An analysis of power reduction techniques in scan testing. ITC 2001: 670-677
21		Jennifer Dworak, Jason D. Wicker, Sooryong Lee, Michael R. Grimaila, M. Ray Mercer, Kenneth M. Butler, Bret Stewart, Li-C. Wang: Defect-Oriented Testing and Defective-Part-Level Prediction. IEEE Design & Test of Computers 18(1): 31-41 (2001)
	2000
20		Jayashree Saxena, Kenneth M. Butler: An empirical study on the effects of test type ordering on overall test efficiency. ITC 2000: 408-416
19		Zoran Stanojevic, Hari Balachandran, D. M. H. Walker, Fred Lakbani, Jayashree Saxena, Kenneth M. Butler: Computer-aided fault to defect mapping (CAFDM) for defect diagnosis. ITC 2000: 729-738
	1999
18		Hari Balachandran, Jason Parker, Gordon Gammie, John W. Olson, Craig Force, Kenneth M. Butler, Sri Jandhyala: Expediting ramp-to-volume production. ITC 1999: 103-112
17		Hari Balachandran, Jason Parker, Daniel Shupp, Stephanie Butler, Kenneth M. Butler, Craig Force, Jason Smith: Correlation of logical failures to a suspect process step. ITC 1999: 458-476
16		Kenneth M. Butler: A study of test quality/tester scan memory trade-offs using the SEMATECH test methods data. ITC 1999: 839-847
15		Michael R. Grimaila, Sooryong Lee, Jennifer Dworak, Kenneth M. Butler, Bret Stewart, Hari Balachandran, Bryan Houchins, Vineet Mathur, Jaehong Park, Li-C. Wang, M. Ray Mercer: REDO - Probabilistic Excitation and Deterministic Observation - First Commercial Experimen. VTS 1999: 268-274
14		Kenneth M. Butler: Estimating the Economic Benefits of DFT. IEEE Design & Test of Computers 16(1): 71-79 (1999)
	1998
13		Jayashree Saxena, Kenneth M. Butler, Hari Balachandran, David B. Lavo, Tracy Larrabee, F. Joel Ferguson, Brian Chess: On applying non-classical defect models to automated diagnosis. ITC 1998: 748-757
	1997
12		Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken, Wojciech Maly: So What Is an Optimal Test Mix? A Discussion of the SEMATECH Methods Experiment. ITC 1997: 1037-1038
11		Kenneth M. Butler: The stuck-at fault: it ain't over 'til it's over. ITC 1997: 1165
10		David B. Lavo, Tracy Larrabee, F. Joel Ferguson, Brian Chess, Jayashree Saxena, Kenneth M. Butler: Bridging Fault Diagnosis in the Absence of Physical Information. ITC 1997: 887-893
9		Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken: An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing. VTS 1997: 459
8		Kenneth M. Butler, Karl Johnson, Jeff Platt, Anjali Kinra, Jayashree Saxena: Automated Diagnosis in Testing and Failure Analysis. IEEE Design & Test of Computers 14(3): 83-89 (1997)
	1996
7		Kenneth M. Butler, Karl Johnson, Jeff Platt, Anjali Jones, Jayashree Saxena: Integrating Automated Diagnosis into the Testing and Failure Analysis Operations. ITC 1996: 934
	1995
6		Graham Hetherington, Greg Sutton, Kenneth M. Butler, Theo J. Powell: Test Generation and Design for Test for a Large Multiprocessing DSP. ITC 1995: 149-156
5		Kenneth M. Butler: Deep Submicron: Is Test Up to the Challenge? ITC 1995: 923
	1991
4		Kenneth M. Butler, Don E. Ross, Rohit Kapur, M. Ray Mercer: Heuristics to Compute Variable Orderings for Efficient Manipulation of Ordered Binary Decision Diagrams. DAC 1991: 417-420
3		Don E. Ross, Kenneth M. Butler, M. Ray Mercer: Exact ordered binary decision diagram size when representing classes of symmetric functions. J. Electronic Testing 2(3): 243-259 (1991)
	1990
2		Kenneth M. Butler, M. Ray Mercer: The Influences of Fault Type and Topology on Fault Model Performance and the Implications to Test and Testable Design. DAC 1990: 673-678
	1988
1		Rhonda Kay Gaede, Don E. Ross, M. Ray Mercer, Kenneth M. Butler: CATAPULT: Concurrent Automatic Testing Allowing Parallelization and Using Limited Topology. DAC 1988: 597-600

Coauthor Index

1	Nisar Ahmed	[32]
2	Robert C. Aitken (Rob Aitken)	[9] [12]
3	Davide Appello	[39]
4	N. V. Arvind	[28]
5	Hari Balachandran	[13] [15] [17] [18] [19] [24]
6	Supatra Basu	[26]
7	John Berech	[26]
8	Stephanie Butler	[17]
9	David J. Campbell	[26]
10	John M. Carulli Jr.	[34] [35] [36] [39] [42]
11	Hsiu-Ming Chang	[40]
12	Kwang-Ting Cheng (Kwang-Ting (Tim) Cheng)	[27] [40]
13	Brian Chess	[10] [13]
14	W. Robert Daasch	[35] [42]
15	Jennifer Dworak	[15] [21]
16	Marco Esposito	[39]
17	F. Joel Ferguson	[10] [13]
18	Craig Force	[17] [18]
19	Tony Fryars	[29]
20	Rhonda Kay Gaede	[1]
21	Gordon Gammie	[18]
22	John Gatt	[26]
23	Dan Glotter	[39]
24	Kapil R. Gotkhindikar	[42]
25	Michael R. Grimaila	[15] [21]
26	Manfred Hachinger	[28]
27	Graham Hetherington	[6] [29]
28	Bryan Houchins	[15]
29	Frank F. Hsu	[23]
30	Sri Jandhyala (Sridhar Jandhyala)	[18]
31	Vinay B. Jayaram	[28]
32	Karl Johnson	[7] [8]
33	Anjali Jones	[7]
34	Rohit Kapur	[4]
35	Anjali Kinra	[8]
36	Sudheendra Phani Kumar	[26]
37	Subhendu Kundu	[28]
38	Fred Lakbani	[19]
39	Tracy Larrabee	[10] [13]
40	David B. Lavo	[10] [13]
41	Sooryong Lee	[15] [21]
42	Xin Li	[40]
43	Wojciech Maly	[12]
44	Erik Jan Marinissen	[39]
45	Vineet Mathur	[15]
46	Peter C. Maxwell	[9] [12]
47	M. Ray Mercer	[1] [2] [3] [4] [15] [21]
48	Amit Nahar	[35] [36] [39] [42]
49	Wayne M. Needham	[9] [12]
50	Phil Nigh	[9] [12]
51	John W. Olson	[18]
52	Sule Ozev	[38] [41]
53	Jaehong Park	[15]
54	Jason Parker	[17] [18]
55	Janak H. Patel	[23]
56	Jeff Platt	[7] [8]
57	Chris Portelli	[39]
58	Theo J. Powell	[6]
59	R. Raghuraman	[26]
60	C. P. Ravikumar	[32]
61	Don E. Ross	[1] [3] [4]
62	Jayashree Saxena	[7] [8] [10] [13] [19] [20] [22] [26] [28] [29] [34] [35]
63	Daniel Shupp	[17]
64	Neil Simpson	[24]
65	Adit Singh	[39]
66	Jason Smith	[17]
67	Pravin Sreeprakash	[28]
68	Zoran Stanojevic	[19]
69	Bret Stewart	[15] [21]
70	Greg Sutton	[6]
71	Mohammad Tehranipoor	[32] [33] [37]
72	D. M. H. Walker (Duncan M. Hank Walker)	[19]
73	Li-C. Wang	[15] [21] [27]
74	Charles Weinberger	[36]
75	Lee Whetsel	[22]
76	Jason D. Wicker	[21]
77	Ender Yilmaz	[38] [41]
78	Wangyang Zhang	[40]

Colors in the list of coauthors

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