Steve Butkovich

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2009

2 Philip B. Geiger, Steve Butkovich: Boundary-scan adoption - an industry snapshot with emphasis on the semiconductor industry. ITC 2009: 1-10

2004

1 Amit Verma, Charles Robinson, Steve Butkovich: Production Test Effectiveness of Combined Automated Inspection and ICT Test Strategies. ITC 2004: 393-402

	2009
2		Philip B. Geiger, Steve Butkovich: Boundary-scan adoption - an industry snapshot with emphasis on the semiconductor industry. ITC 2009: 1-10
	2004
1		Amit Verma, Charles Robinson, Steve Butkovich: Production Test Effectiveness of Combined Automated Inspection and ICT Test Strategies. ITC 2004: 393-402

Coauthor Index

1 Philip B. Geiger [2]

2 Charles Robinson [1]

3 Amit Verma [1]

Colors in the list of coauthors

Last update Sun May 27 04:04:01 2012 CET by the DBLP Team —

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