Mihai G. Burzo

	2008
2		Peter E. Raad, Pavel L. Komarov, Mihai G. Burzo: Thermal characterization of embedded electronic features by an integrated system of CCD thermography and self-adaptive numerical modeling. Microelectronics Journal 39(7): 1008-1015 (2008)
	2003
1		Pavel L. Komarov, Mihai G. Burzo, Gunhan Kaytaz, Peter E. Raad: Transient thermo-reflectance measurements of the thermal conductivity and interface resistance of metallized natural and isotopically-pure silicon. Microelectronics Journal 34(12): 1115-1118 (2003)

Coauthor Index

1	Gunhan Kaytaz	[1]
2	Pavel L. Komarov	[1] [2]
3	Peter E. Raad	[1] [2]

Last update Sun May 27 04:04:01 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page