Jay S. Burnham

	2005
2		Terence B. Hook, Ronald J. Bolam, William Clark, Jay S. Burnham, Nivo Rovedo, Laura Schutz: Negative bias temperature instability on three oxide thicknesses (1.4/2.2/5.2 nm) with nitridation variations and deuteration. Microelectronics Reliability 45(1): 47-56 (2005)
	1999
1		Terence B. Hook, Jay S. Burnham, Ronald J. Bolam: Nitrided gate oxides for 3.3-V logic application: Reliability and device design considerations. IBM Journal of Research and Development 43(3): 393-406 (1999)

Coauthor Index

1	Ronald J. Bolam	[1] [2]
2	William Clark	[2]
3	Terence B. Hook	[1] [2]
4	Nivo Rovedo	[2]
5	Laura Schutz	[2]

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