Alexander Burenkov

	1998
1		Walter Bohmayr, Alexander Burenkov, Jürgen Lorenz, Heiner Ryssel, Siegfried Selberherr: Monte Carlo simulation of silicon amorphization during ion implantation. IEEE Trans. on CAD of Integrated Circuits and Systems 17(12): 1236-1243 (1998)

Coauthor Index

1	Walter Bohmayr	[1]
2	Jürgen Lorenz	[1]
3	Heiner Ryssel	[1]
4	Siegfried Selberherr	[1]

Last update Sun May 27 04:04:01 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page