 | 2008 |
| 12 |  | Yajie Chen,
Steve Hall,
Liam McDaid,
Octavian Buiu,
Peter M. Kelly:
A Solid-State Neuron for Spiking Neural Network Implementation.
Engineering Letters 16(1): 83-89 (2008) |
| 2007 |
| 11 |  | Thomas Dowrick,
Steve Hall,
Liam McDaid,
Octavian Buiu,
Peter M. Kelly:
A Biologically Plausible Neuron Circuit.
IJCNN 2007: 715-719 |
| 10 |  | Yajie Chen,
Steve Hall,
Liam McDaid,
Octavian Buiu,
Peter M. Kelly:
Analog Spiking Neuron with Charge-Coupled Synapses.
World Congress on Engineering 2007: 440-444 |
| 9 |  | I. Z. Mitrovic,
Octavian Buiu,
Steve Hall,
C. Bungey,
T. Wagner,
W. Davey,
Y. Lu:
Electrical and structural properties of hafnium silicate thin films.
Microelectronics Reliability 47(4-5): 645-648 (2007) |
| 8 |  | Octavian Buiu,
Steve Hall,
O. Engstrom,
B. Raeissi,
M. Lemme,
P. K. Hurley,
K. Cherkaoui:
Extracting the relative dielectric constant for "high-kappa layers" from CV measurements - Errors and error propagation.
Microelectronics Reliability 47(4-5): 678-681 (2007) |
| 7 |  | Y. V. Gomeniuk,
A. N. Nazarov,
Ya. N. Vovk,
V. S. Lysenko,
Yi Lu,
Octavian Buiu,
Steve Hall,
R. J. Potter,
P. Chalker:
Charge trapping and interface states in hydrogen annealed HfO2-Si structures.
Microelectronics Reliability 47(4-5): 714-717 (2007) |
| 6 |  | Y. Lu,
Octavian Buiu,
Steve Hall,
I. Z. Mitrovic,
W. Davey,
R. J. Potter,
P. R. Chalker:
Tuneable electrical properties of hafnium aluminate gate dielectrics deposited by metal organic chemical vapour deposition.
Microelectronics Reliability 47(4-5): 722-725 (2007) |
| 5 |  | I. P. Tyagulskyy,
I. N. Osiyuk,
V. S. Lysenko,
A. N. Nazarov,
Steve Hall,
Octavian Buiu,
Y. Lu,
R. Potter,
P. Chalker:
Charge trapping characterization of MOCVD HfO2/p-Si interfaces at cryogenic temperatures.
Microelectronics Reliability 47(4-5): 726-728 (2007) |
| 4 |  | P. Taechakumput,
S. Taylor,
Octavian Buiu,
R. J. Potter,
P. R. Chalker,
A. C. Jones:
Optical and electrical characterization of hafnium oxide deposited by liquid injection atomic layer deposition.
Microelectronics Reliability 47(4-5): 825-829 (2007) |
| 2006 |
| 3 |  | Yajie Chen,
Steve Hall,
Liam McDaid,
Octavian Buiu,
Peter M. Kelly:
On the Design of a Low Power Compact Spiking Neuron Cell Based on Charge-Coupled Synapses.
IJCNN 2006: 1511-1517 |
| 2 |  | Yajie Chen,
Steve Hall,
Liam McDaid,
Octavian Buiu,
Peter M. Kelly:
A Silicon Synapse Based on a Charge Transfer Device for Spiking Neural Network Application.
ISNN (2) 2006: 1366-1373 |
| 2005 |
| 1 |  | Y. Lu,
Octavian Buiu,
Steve Hall,
P. K. Hurley:
Optical and electrical characterization of hafnium oxide deposited by MOCVD.
Microelectronics Reliability 45(5-6): 965-968 (2005) |