Gyoung Ho Buh

	2005
1		Jin-Wook Lee, Gyoung Ho Buh, Guk-Hyon Yon, Tai-su Park, Yu Gyun Shin, U-In Chung, Joo Tae Moon: Elimination of surface state induced edge transistors in high voltage NMOSFETs for flash memory devices. Microelectronics Reliability 45(9-11): 1394-1397 (2005)

Coauthor Index

1	U-In Chung	[1]
2	Jin-Wook Lee	[1]
3	Joo Tae Moon	[1]
4	Tai-su Park	[1]
5	Yu Gyun Shin	[1]
6	Guk-Hyon Yon	[1]

Last update Sun May 27 04:04:01 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page