Paulo Marcos Siqueira Bueno

	2008
6		Paulo Marcos Siqueira Bueno, Adalberto Nobiato Crespo, Clenio F. Salviano, Mario Jino: Analysis of an Artifact Oriented Test Process Model and of Testing Aspects of ISO/IEC 15504. JIISIC 2008: 147-154
5		Paulo Marcos Siqueira Bueno, W. Eric Wong, Mario Jino: Automatic test data generation using particle systems. SAC 2008: 809-814
	2006
4		Paulo Marcos Siqueira Bueno, Adalberto Nobiato Crespo, Mario Jino: Analysis of an Artifact Oriented Test Process Model and of Testing Aspects of CMMI. PROFES 2006: 263-277
	2002
3		Paulo Marcos Siqueira Bueno, Mario Jino: Automatic Test Data Generation for Program Paths Using Genetic Algorithms. International Journal of Software Engineering and Knowledge Engineering 12(6): 691-709 (2002)
	2001
2		Paulo Marcos Siqueira Bueno, Mario Jino: Automatic Test Data Generation for Program Paths Using Genetic Algorithms. SEKE 2001: 2-9
	2000
1		Paulo Marcos Siqueira Bueno, Mario Jino: Identification of Potentially Infeasible Program Paths by Monitoring the Search for Test Data. ASE 2000: 209-218

Coauthor Index

1	Adalberto Nobiato Crespo	[4] [6]
2	Mario Jino	[1] [2] [3] [4] [5] [6]
3	Clenio F. Salviano	[6]
4	W. Eric Wong	[5]

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