 | 2011 |
| 9 |  | Aymen Grira,
Bernard Legrand,
Christine Rotinat-Libersa,
Estelle Mairiaux,
Lionel Buchaillot:
Optimal design of non intuitive compliant microgripper with high resolution.
IROS 2011: 45-50 |
| 2010 |
| 8 |  | E. Herth,
Bernard Legrand,
Lionel Buchaillot,
N. Rolland,
T. Lasri:
Optimization of SiNX: H films deposited by PECVD for reliability of electronic, microsystems and optical applications.
Microelectronics Reliability 50(8): 1103-1106 (2010) |
| 2008 |
| 7 |  | Cedric Durand,
Fabrice Casset,
Pacal Ancey,
Fabienne Judong,
Alexandre Talbot,
Reni Quenouillere,
Denis Renaud,
Stephan Borel,
Brigitte Florin,
Lionel Buchaillot:
Silicon on Nothing Mems Electromechanical Resonator
CoRR abs/0802.3051: (2008) |
| 6 |  | Renaud Robin,
Salim Touati,
Karim Segueni,
Olivier Millet,
Lionel Buchaillot:
A New Four States High Deflection Low Actuation Voltage Electrostatic Mems Switch for RF Applications
CoRR abs/0805.0934: (2008) |
| 2007 |
| 5 |  | A.-S. Rollier,
M. Faucher,
Bernard Legrand,
Dominique Collard,
Lionel Buchaillot:
Electrostatic Actuators Operating in Liquid Environment : Suppression of Pull-in Instability and Dynamic Response
CoRR abs/0711.3321: (2007) |
| 2005 |
| 4 |  | K. Yacine,
F. Flourens,
D. Bourrier,
L. Salvagnac,
P. Calmont,
X. Lafontan,
Q.-H. Duong,
Lionel Buchaillot,
D. Peyrou,
Patrick Pons:
Biaxial initial stress characterization of bilayer gold RF-switches.
Microelectronics Reliability 45(9-11): 1776-1781 (2005) |
| 3 |  | Q.-H. Duong,
Lionel Buchaillot,
Dominique Collard,
P. Schmitt,
X. Lafontan,
Patrick Pons,
F. Flourens,
F. Pressecq:
Thermal and electrostatic reliability characterization in RF MEMS switches.
Microelectronics Reliability 45(9-11): 1790-1793 (2005) |
| 2003 |
| 2 |  | Dimitri Galayko,
Andreas Kaiser,
Lionel Buchaillot,
Dominique Collard,
Chantal Combi:
Electrostatical coupling-spring for micro-mechanical filtering applications.
ISCAS (3) 2003: 530-533 |
| 1 |  | Lionel Buchaillot:
Feedback of MEMS reliability study on the design stage: a step toward Reliability Aided Design (RAD).
Microelectronics Reliability 43(9-11): 1919-1928 (2003) |