 | 2009 |
|---|
| 8 |       | Antonin Bougerol,
Florent Miller,
Nadine Buard:
Novel DRAM mitigation technique.
IOLTS 2009: 109-113 |
| 2008 |
|---|
| 7 | | Antonin Bougerol,
Florent Miller,
Nadine Buard:
SDRAM Architecture & Single Event Effects Revealed with Laser.
IOLTS 2008: 283-288 |
| 2007 |
|---|
| 6 | | Claudia Rusu,
Antonin Bougerol,
Lorena Anghel,
Cécile Weulersse,
Nadine Buard,
S. Benhammadi,
Nicolas Renaud,
Guillaume Hubert,
Frederic Wrobel,
Thierry Carrière,
Rémi Gaillard:
Multiple Event Transient Induced by Nuclear Reactions in CMOS Logic Cells.
IOLTS 2007: 137-145 |
| 5 | | Nadine Buard,
Florent Miller,
Cédric Ruby,
Rémi Gaillard:
Latchup effect in CMOS IC: a solution for crypto-processors protection against fault injection attacks?
IOLTS 2007: 63-70 |
| 2006 |
|---|
| 4 | | Guillaume Hubert,
Antonin Bougerol,
Florent Miller,
Nadine Buard,
Lorena Anghel,
Thierry Carrière,
Frederic Wrobel,
Rémi Gaillard:
Prediction of Transient Induced by Neutron/Proton in CMOS Combinational Logic Cells.
IOLTS 2006: 63-74 |
| 3 | | Lorena Anghel,
Michael Nicolaidis,
Nadine Buard:
From Nuclear Reaction to System Failures: Can We Address All Levels of Soft Errors Accurately?
IOLTS 2006: 85 |
| 2005 |
|---|
| 2 | | Guillaume Hubert,
Nadine Buard,
Cécile Weulersse,
Thierry Carrière,
Marie-Catherine Palau,
Jean-Marie Palau,
Damien Lambert,
Jacques Baggio,
Frederic Wrobel,
Frédéric Saigné,
Rémi Gaillard:
A Review of DASIE Code Family: Contribution to SEU/MBU Understanding.
IOLTS 2005: 87-94 |
| 2003 |
|---|
| 1 | | F. Darracq,
Hervé Lapuyade,
Nadine Buard,
Pascal Fouillat,
R. Dufayel,
Thierry Carrière:
Low-cost backside laser test method to pre-characterize the COTS IC's sensitivity to Single Event Effects.
Microelectronics Reliability 43(9-11): 1615-1619 (2003) |
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