Ngoi Kok Ann Bryan

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2004

1 Yongqi Fu, Zhongwei Shen, Ngoi Kok Ann Bryan: A novel harmless trimming for micro-device with defects and particles in arbitrary geometry by fine milling of focused ion beam. Microelectronics Journal 35(2): 111-115 (2004)

	2004
1		Yongqi Fu, Zhongwei Shen, Ngoi Kok Ann Bryan: A novel harmless trimming for micro-device with defects and particles in arbitrary geometry by fine milling of focused ion beam. Microelectronics Journal 35(2): 111-115 (2004)

Coauthor Index

1 Yongqi Fu [1]

2 Zhongwei Shen [1]

Last update Sun May 27 04:04:01 2012 CET by the DBLP Team —

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