Michael J. Bryan

	1992
2		Michael J. Bryan, Srinivas Devadas, Kurt Keutzer: Necessary and sufficient conditions for hazard-free robust transistor stuck-open-fault testability in multilevel networks. IEEE Trans. on CAD of Integrated Circuits and Systems 11(6): 800-803 (1992)
	1990
1		Michael J. Bryan, Srinivas Devadas, Kurt Keutzer: Testability-Preserving Circuit Transformations. ICCAD 1990: 456-459

Coauthor Index

1	Srinivas Devadas	[1] [2]
2	Kurt Keutzer	[1] [2]

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