Frank Brunner

	2011
3		J. Wuerfl, Eldad Bahat-Treidel, Frank Brunner, E. Cho, O. Hilt, Ponky Ivo, A. Knauer, Paul Kurpas, Richard Lossy, M. Schulz, S. Singwald, Markus Weyers, R. Zhytnytska: Reliability issues of GaN based high voltage power devices. Microelectronics Reliability 51(9-11): 1710-1716 (2011)
	2003
2		Frank Brunner, A. Braun, Paul Kurpas, J. Schneider, Joachim Würfl, Markus Weyers: Investigation of short-term current gain stability of GaInP/GaAs-HBTs grown by MOVPE. Microelectronics Reliability 43(6): 839-844 (2003)
	2001
1		Joachim Würfl, Paul Kurpas, Frank Brunner, Michael Mai, Matthias Rudolph, Markus Weyers: Degradation properties of MOVPE-grown GaInP/GaAs HBTs under combined temperature and current stressing. Microelectronics Reliability 41(8): 1103-1108 (2001)

Coauthor Index

1	Eldad Bahat-Treidel	[3]
2	A. Braun	[2]
3	E. Cho	[3]
4	O. Hilt	[3]
5	Ponky Ivo	[3]
6	A. Knauer	[3]
7	Paul Kurpas	[1] [2] [3]
8	Richard Lossy	[3]
9	Michael Mai	[1]
10	Matthias Rudolph	[1]
11	J. Schneider	[2]
12	M. Schulz	[3]
13	S. Singwald	[3]
14	Markus Weyers	[1] [2] [3]
15	J. Wuerfl	[3]
16	Joachim Würfl	[1] [2]
17	R. Zhytnytska	[3]

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