Eric Bruls

E. M. J. G. Bruls

	1997
8		R. de Vries, Taco Zwemstra, E. M. J. G. Bruls, Paul P. L. Regtien: Built-in self-test methodology for A/D converters. ED&TC 1997: 353-358
	1996
7		Marly Roncken, Eric Bruls: Test Quality of Asynchronous Circuits: A Defect-oriented Evaluation. ITC 1996: 205-214
6		Rosa Rodríguez-Montañés, E. M. J. G. Bruls, Joan Figueras: Bridging defects resistance in the metal layer of a CMOS process. J. Electronic Testing 8(1): 35-46 (1996)
	1994
5		Eric Bruls: Variable Supply Voltage Testing for Analogue CMOS and Bipolar Circuits. ITC 1994: 562-571
4		R. J. A. Harvey, Andrew M. D. Richardson, Eric Bruls, Keith Baker: Analogue Fault Simulation Based on Layout-Dependent Fault Models. ITC 1994: 641-649
	1993
3		M. M. A. van Rosmalen, Keith Baker, Eric Bruls, Jochen A. G. Jess: Parameter Monitoring: Advantages and Pitfalls. ITC 1993: 115-124
	1992
2		Rosa Rodríguez-Montañés, Joan Figueras, Eric Bruls: Bridging Defects Resistance Measurements in a CMOS Process. ITC 1992: 892-899
	1991
1		Eric Bruls, F. Camerik, H. J. Kretschman, Jochen A. G. Jess: A Generic Method to Develop a Defect Monitoring System for IC Processes. ITC 1991: 218-227

Coauthor Index

1	Keith Baker	[3] [4]
2	F. Camerik	[1]
3	Joan Figueras	[2] [6]
4	R. J. A. Harvey	[4]
5	Jochen A. G. Jess	[1] [3]
6	H. J. Kretschman	[1]
7	Paul P. L. Regtien	[8]
8	Andrew M. D. Richardson	[4]
9	Rosa Rodríguez-Montañés	[2] [6]
10	Marly Roncken	[7]
11	M. M. A. van Rosmalen	[3]
12	R. de Vries	[8]
13	Taco Zwemstra	[8]

Colors in the list of coauthors

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