Tomasz Brozek

	2005
2		Tomasz Brozek: Editorial. Microelectronics Reliability 45(1): 1-2 (2005)
	2002
1		Mahesh S. Krishnan, Viktor Kol'dyaev, Eiji Morifoji, Koji Miyamoto, Tomasz Brozek, Xiaolei Li: Series resistance degradation due to NBTI in PMOSFET. Microelectronics Reliability 42(9-11): 1433-1438 (2002)

Coauthor Index

1	Viktor Kol'dyaev	[1]
2	Mahesh S. Krishnan	[1]
3	Xiaolei Li	[1]
4	Koji Miyamoto	[1]
5	Eiji Morifoji	[1]

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