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| 1984 | ||
|---|---|---|
| 3 | Robert S. Broughton, Michael G. Brashler: The Future is Now: Extending CAE into Test of Custom VLSI. ITC 1984: 462-465 | |
| 1983 | ||
| 2 | Robert S. Broughton: Structured Logic Analysis for Manufacturing Testing. ITC 1983: 538-545 | |
| 1981 | ||
| 1 | Robert S. Broughton: Data Management for Large Memory Device Characterization. ITC 1981: 381-387 | |
| 1 | Michael G. Brashler | [3] |
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