Stephane Bronckers

	2011
7		Geert Van der Plas, Paresh Limaye, Igor Loi, Abdelkarim Mercha, Herman Oprins, Cristina Torregiani, Steven Thijs, Dimitri Linten, Michele Stucchi, Guruprasad Katti, Dimitrios Velenis, Vladimir Cherman, Bart Vandevelde, Veerle Simons, Ingrid De Wolf, Riet Labie, Dan Perry, Stephane Bronckers, Nikolaos Minas, Miro Cupac, Wouter Ruythooren, Jan Van Olmen, Alain Phommahaxay, Muriel de Potter de ten Broeck, Ann Opdebeeck, Michal Rakowski, Bart De Wachter, Morin Dehan, Marc Nelis, Rahul Agarwal, Antonio Pullini, Federico Angiolini, Luca Benini, Wim Dehaene, Youssef Travaly, Eric Beyne, Paul Marchal: Design Issues and Considerations for Low-Cost 3-D TSV IC Technology. J. Solid-State Circuits 46(1): 293-307 (2011)
	2010
6		Geert Van der Plas, Paresh Limaye, Abdelkarim Mercha, Herman Oprins, Cristina Torregiani, Steven Thijs, Dimitri Linten, Michele Stucchi, Guruprasad Katti, Dimitrios Velenis, Domae Shinichi, Vladimir Cherman, Bart Vandevelde, Veerle Simons, Ingrid De Wolf, Riet Labie, Dan Perry, Stephane Bronckers, Nikolaos Minas, Miro Cupac, Wouter Ruythooren, Jan Van Olmen, Alain Phommahaxay, Muriel de Potter de ten Broeck, Ann Opdebeeck, Michal Rakowski, Bart De Wachter, Morin Dehan, Marc Nelis, Rahul Agarwal, Wim Dehaene, Youssef Travaly, Pol Marchal, Eric Beyne: Design issues and considerations for low-cost 3D TSV IC technology. ISSCC 2010: 148-149
5		Stephane Bronckers, Geert Van der Plas, Gerd Vandersteen, Yves Rolain: Substrate Noise Coupling Mechanisms in Lightly Doped CMOS Transistors. IEEE T. Instrumentation and Measurement 59(6): 1727-1733 (2010)
	2009
4		Stephane Bronckers, Gerd Vandersteen, Ludwig De Locht, Michael Libois, Geert Van der Plas, Yves Rolain: Experimental Analysis of the Coupling Mechanisms Between a 4 GHz PPA and a 5-7 GHz LC -VCO. IEEE T. Instrumentation and Measurement 58(8): 2706-2713 (2009)
3		Stephane Bronckers, Karen Scheir, Geert Van der Plas, Gerd Vandersteen, Yves Rolain: A Methodology to Predict the Impact of Substrate Noise in Analog/RF Systems. IEEE Trans. on CAD of Integrated Circuits and Systems 28(11): 1613-1626 (2009)
	2007
2		Stephane Bronckers, Charlotte Soens, Geert Van der Plas, Gerd Vandersteen, Yves Rolain: Interactive presentation: Simulation methodology and experimental verification for the analysis of substrate noise on LC-VCO's. DATE 2007: 1520-1525
	2006
1		Gerd Vandersteen, Stephane Bronckers, Petr Dobrovolný, Yves Rolain: Systematic stability-analysis method for analog circuits. DATE 2006: 150-155

Coauthor Index

1	Rahul Agarwal	[6] [7]
2	Federico Angiolini	[7]
3	Luca Benini	[7]
4	Eric Beyne	[6] [7]
5	Muriel de Potter de ten Broeck	[6] [7]
6	Vladimir Cherman	[6] [7]
7	Miro Cupac	[6] [7]
8	Wim Dehaene	[6] [7]
9	Morin Dehan	[6] [7]
10	Petr Dobrovolný	[1]
11	Guruprasad Katti	[6] [7]
12	Riet Labie	[6] [7]
13	Michael Libois	[4]
14	Paresh Limaye	[6] [7]
15	Dimitri Linten	[6] [7]
16	Ludwig De Locht	[4]
17	Igor Loi	[7]
18	Paul Marchal (Pol Marchal)	[6] [7]
19	Abdelkarim Mercha	[6] [7]
20	Nikolaos Minas	[6] [7]
21	Marc Nelis	[6] [7]
22	Jan Van Olmen	[6] [7]
23	Ann Opdebeeck	[6] [7]
24	Herman Oprins	[6] [7]
25	Dan Perry	[6] [7]
26	Alain Phommahaxay	[6] [7]
27	Geert Van der Plas	[2] [3] [4] [5] [6] [7]
28	Antonio Pullini	[7]
29	Michal Rakowski	[6] [7]
30	Yves Rolain	[1] [2] [3] [4] [5]
31	Wouter Ruythooren	[6] [7]
32	Karen Scheir	[3]
33	Domae Shinichi	[6]
34	Veerle Simons	[6] [7]
35	Charlotte Soens	[2]
36	Michele Stucchi	[6] [7]
37	Steven Thijs	[6] [7]
38	Cristina Torregiani	[6] [7]
39	Youssef Travaly	[6] [7]
40	Gerd Vandersteen	[1] [2] [3] [4] [5]
41	Bart Vandevelde	[6] [7]
42	Dimitrios Velenis	[6] [7]
43	Bart De Wachter	[6] [7]
44	Ingrid De Wolf	[6] [7]

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