M. de Potter de ten Broeck

	2007
2		A. Rothschild, R. Mitsuhashi, C. Kerner, X. Shi, J. L. Everaert, L. Date, Thierry Conard, Olivier Richard, C. Vrancken, R. Verbeeck, A. Veloso, A. Lauwers, M. de Potter de ten Broeck, I. Debusschere, M. Jurczak, M. Niwa, P. Absil, S. Biesemans: Optimization of HfSiON using a design of experiment (DOE) approach on 0.45 V Vt Ni-FUSI CMOS transistors. Microelectronics Reliability 47(4-5): 521-524 (2007)
	2005
1		E. Sleeckx, Marc Schaekers, X. Shi, E. Kunnen, B. Degroote, M. Jurczak, M. de Potter de ten Broeck, E. Augendre: Optimization of low temperature silicon nitride processes for improvement of device performance. Microelectronics Reliability 45(5-6): 865-868 (2005)

Coauthor Index

1	P. Absil	[2]
2	E. Augendre	[1]
3	S. Biesemans	[2]
4	Thierry Conard	[2]
5	L. Date	[2]
6	I. Debusschere	[2]
7	B. Degroote	[1]
8	J. L. Everaert	[2]
9	M. Jurczak	[1] [2]
10	C. Kerner	[2]
11	E. Kunnen	[1]
12	A. Lauwers	[2]
13	R. Mitsuhashi	[2]
14	M. Niwa	[2]
15	Olivier Richard	[2]
16	A. Rothschild	[2]
17	Marc Schaekers	[1]
18	X. Shi	[1] [2]
19	E. Sleeckx	[1]
20	A. Veloso	[2]
21	R. Verbeeck	[2]
22	C. Vrancken	[2]

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