 | 2010 |
|---|
| 7 |       | O. Briat,
J.-M. Vinassa,
N. Bertrand,
H. El Brouji,
J.-Y. Delétage,
Eric Woirgard:
Contribution of calendar ageing modes in the performances degradation of supercapacitors during power cycling.
Microelectronics Reliability 50(9-11): 1796-1803 (2010) |
| 2009 |
|---|
| 6 | | H. El Brouji,
O. Briat,
J.-M. Vinassa,
H. Henry,
E. Woirgard:
Analysis of the dynamic behavior changes of supercapacitors during calendar life test under several voltages and temperatures conditions.
Microelectronics Reliability 49(9-11): 1391-1397 (2009) |
| 2008 |
|---|
| 5 | | H. El Brouji,
O. Briat,
J.-M. Vinassa,
N. Bertrand,
E. Woirgard:
Comparison between changes of ultracapacitors model parameters during calendar life and power cycling ageing tests.
Microelectronics Reliability 48(8-9): 1473-1478 (2008) |
| 2007 |
|---|
| 4 | | W. Lajnef,
J.-M. Vinassa,
O. Briat,
H. El Brouji,
E. Woirgard:
Monitoring fading rate of ultracapacitors using online characterization during power cycling.
Microelectronics Reliability 47(9-11): 1751-1755 (2007) |
| 2006 |
|---|
| 3 | | O. Briat,
W. Lajnef,
J.-M. Vinassa,
E. Woirgard:
Power cycling tests for accelerated ageing of ultracapacitors.
Microelectronics Reliability 46(9-11): 1445-1450 (2006) |
| 2005 |
|---|
| 2 | | W. Lajnef,
J.-M. Vinassa,
O. Briat,
E. Woirgard:
Specification and use of pulsed current profiles for ultracapacitors power cycling.
Microelectronics Reliability 45(9-11): 1746-1749 (2005) |
| 2003 |
|---|
| 1 | | Stephane Azzopardi,
E. Woirgard,
J.-M. Vinassa,
O. Briat,
C. Zardini:
IGBT Power modules thermal characterization : what is the optimum between a low current - high voltage or a high current - low voltage test condition for the same electrical power?
Microelectronics Reliability 43(9-11): 1901-1906 (2003) |
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