Juraj Brenkus

	2011
4		Gábor Gyepes, Juraj Brenkus, Daniel Arbet, Viera Stopjaková: Comparison of iddt test efficiency in covering opens in SRAMs realised in two different technologies. DDECS 2011: 395-396
3		Daniel Arbet, Juraj Brenkus, Gábor Gyepes, Viera Stopjaková: Increasing the efficiency of analog OBIST using on-chip compensation of technology variations. DDECS 2011: 71-74
	2009
2		Juraj Brenkus, Viera Stopjaková, Ronny Vanhooren, Anton Chichkov: Comparison of different test strategies on a mixed-signal circuit. DDECS 2009: 16-19
	2008
1		Juraj Brenkus, Viera Stopjaková, Jozef Mihálov: Experimental Analog Circuit for Parametric Test Methods Efficiency Evaluation. DDECS 2008: 293-298

Coauthor Index

1	Daniel Arbet	[3] [4]
2	Anton Chichkov	[2]
3	Gábor Gyepes	[3] [4]
4	Jozef Mihálov	[1]
5	Viera Stopjaková	[1] [2] [3] [4]
6	Ronny Vanhooren	[2]

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