Peter Breitschopf

	2008
2		Roland Biberger, Guenther Benstetter, Thomas Schweinboeck, Peter Breitschopf, Holger Goebel: Intermittent-contact scanning capacitance microscopy versus contact mode SCM applied to 2D dopant profiling. Microelectronics Reliability 48(8-9): 1339-1342 (2008)
	2005
1		Peter Breitschopf, Guenther Benstetter, Bernhard Knoll, Werner Frammelsberger: Intermittent contact scanning capacitance microscopy-An improved method for 2D doping profiling. Microelectronics Reliability 45(9-11): 1568-1571 (2005)

Coauthor Index

1	Guenther Benstetter	[1] [2]
2	Roland Biberger	[2]
3	Werner Frammelsberger	[1]
4	Holger Goebel	[2]
5	Bernhard Knoll	[1]
6	Thomas Schweinboeck	[2]

Last update Sun May 27 04:04:01 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page