R. Frost Brandenburg

	2007
1		R. Frost Brandenburg, D. Rudolph, Christian Galke, René Kothe, Heinrich Theodor Vierhaus: A Configurable Modular Test Processor and Scan Controller Architecture. IOLTS 2007: 277-284

Coauthor Index

1	Christian Galke	[1]
2	René Kothe	[1]
3	D. Rudolph	[1]
4	Heinrich Theodor Vierhaus	[1]

Last update Sun May 27 04:04:01 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page