Sanjib Kumar Brahma

	2011
2		Sanjib Kumar Brahma, Arkadiusz Glowacki, Reiner Leihkauf, Christian Boit: Laser induced impact ionization effect in MOSFET during 1064 nm laser stimulation. Microelectronics Reliability 51(9-11): 1652-1657 (2011)
	2005
1		Sanjib Kumar Brahma, Christian Boit, Arkadiusz Glowacki: Seebeck Effect Detection on Biased Device without OBIRCH Distortion Using FET Readout. Microelectronics Reliability 45(9-11): 1487-1492 (2005)

Coauthor Index

1	Christian Boit	[1] [2]
2	Arkadiusz Glowacki	[1] [2]
3	Reiner Leihkauf	[2]

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