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| 1982 | ||
|---|---|---|
| 1 | I. M. Watson, John A. Newkirk, Robert G. Mathews, D. B. Boyle: ICTEST : A Unified System for Functional Testing and Simulation of Digital ICs. ITC 1982: 499-502 | |
| 1 | Robert G. Mathews | [1] |
| 2 | John A. Newkirk | [1] |
| 3 | I. M. Watson | [1] |
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