 | 2012 |
| 3 |  | E. Marcault,
M. Breil,
A. Bourennane,
P. Tounsi,
J. M. Dorkel:
Study of mechanical stress impact on the I-V characteristics of a power VDMOS device using 2D FEM simulations.
Microelectronics Reliability 52(3): 489-496 (2012) |
| 2006 |
| 2 |  | A. Bourennane,
M. Breil,
J. L. Sanchez,
J. Jalade:
A vertical monolithical MOS thyristor bi-directional device.
Microelectronics Journal 37(3): 223-230 (2006) |
| 2004 |
| 1 |  | A. Bourennane,
M. Breil,
J. L. Sanchez,
P. Austin,
J. Jalade:
A new triggering mode in a vertical bi-directional MOS-thyristor device.
Microelectronics Journal 35(3): 277-285 (2004) |