Ahcène Bounceur

	2011
12		Ahcène Bounceur, Salvador Mir, Haralampos-G. D. Stratigopoulos: Estimation of Analog Parametric Test Metrics Using Copulas. IEEE Trans. on CAD of Integrated Circuits and Systems 30(9): 1400-1410 (2011)
	2010
11		Salvador Mir, Haralampos-G. D. Stratigopoulos, Ahcène Bounceur: Density estimation for analog/RF test problem solving. VTS 2010: 41
	2009
10		Haralampos-G. D. Stratigopoulos, Salvador Mir, Ahcène Bounceur: Evaluation of Analog/RF Test Measurements at the Design Stage. IEEE Trans. on CAD of Integrated Circuits and Systems 28(4): 582-590 (2009)
9		Achraf Dhayni, Salvador Mir, Libor Rufer, Ahcène Bounceur, Emmanuel Simeu: Pseudorandom BIST for test and characterization of linear and nonlinear MEMS. Microelectronics Journal 40(7): 1054-1061 (2009)
	2007
8		Ahcène Bounceur, Salvador Mir, Emmanuel Simeu, Luís Rolíndez: Estimation of Test Metrics for the Optimisation of Analogue Circuit Testing. J. Electronic Testing 23(6): 471-484 (2007)
	2006
7		Achraf Dhayni, Salvador Mir, Libor Rufer, Ahcène Bounceur: Pseudorandom functional BIST for linear and nonlinear MEMS. DATE 2006: 664-669
6		Ahcène Bounceur, Salvador Mir, Luís Rolíndez, Emmanuel Simeu: CAT platform for analogue and mixed-signal test evaluation and optimization. VLSI-SoC 2006: 320-325
5		Livier Lizarraga, Salvador Mir, Gilles Sicard, Ahcène Bounceur: Study of a BIST Technique for CMOS Active Pixel Sensors. VLSI-SoC 2006: 326-331
4		Luís Rolíndez, Salvador Mir, Ahcène Bounceur, Jean-Louis Carbonéro: A SNDR BIST for Sigma-Delta Analogue-to-Digital Converters. VTS 2006: 314-319
3		Luís Rolíndez, Salvador Mir, Ahcène Bounceur, Jean-Louis Carbonéro: A BIST Scheme for SNDR Testing of SigmaDelta ADCs Using Sine-Wave Fitting. J. Electronic Testing 22(4-6): 325-335 (2006)
	2005
2		Achraf Dhayni, Salvador Mir, Libor Rufer, Ahcène Bounceur: On-chip Pseudorandom Testing for Linear and Nonlinear MEMS. VLSI-SoC 2005: 245-266
	2004
1		Luís Rolíndez, Salvador Mir, Guillaume Prenat, Ahcène Bounceur: A 0.18 µm CMOS Implementation of On-chip Analogue Test Signal Generation from Digital Test Patterns. DATE 2004: 706-707

Coauthor Index

1	Jean-Louis Carbonéro	[3] [4]
2	Achraf Dhayni	[2] [7] [9]
3	Livier Lizarraga	[5]
4	Salvador Mir	[1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12]
5	Guillaume Prenat	[1]
6	Luís Rolíndez	[1] [3] [4] [6] [8]
7	Libor Rufer	[2] [7] [9]
8	Gilles Sicard	[5]
9	Emmanuel Simeu	[6] [8] [9]
10	Haralampos-G. D. Stratigopoulos	[10] [11] [12]

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