Younes Boulghassoul

	2007
2		Riaz Naseer, Jeff Draper, Younes Boulghassoul, Sandeepan DasGupta, Art Witulski: Critical charge and set pulse widths for combinational logic in commercial 90nm cmos technology. ACM Great Lakes Symposium on VLSI 2007: 227-230
1		Riaz Naseer, Younes Boulghassoul, Jeff Draper, Sandeepan DasGupta, Art Witulski: Critical Charge Characterization for Soft Error Rate Modeling in 90nm SRAM. ISCAS 2007: 1879-1882

Coauthor Index

1	Sandeepan DasGupta	[1] [2]
2	Jeffrey T. Draper (Jeff Draper)	[1] [2]
3	Riaz Naseer	[1] [2]
4	Art Witulski	[1] [2]

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