 | 2011 |
| 10 |  | Emmanuel Hardy,
Hassan Ihs,
Christian Dufaza,
Stéphane Meillére,
Rachid Bouchakour:
A partial tree vector quantizer dynamic element matching technique for audio Δ-Σ converters.
CICC 2011: 1-4 |
| 9 |  | A. Marzaki,
V. Bidal,
R. Laffont,
Wenceslas Rahajandraibe,
Jean Michel Portal,
Rachid Bouchakour:
PSP based DCG-FGT transistor model including characterization procedure.
ICECS 2011: 228-231 |
| 2009 |
| 8 |  | Haddad Fayrouz,
Wenceslas Rahajandraibe,
Zaid Lakhdar,
Oussama Frioui,
Rachid Bouchakour:
Radio frequency tunable polyphase filter design.
ICECS 2009: 21-24 |
| 7 |  | J. Postel-Pellerin,
F. Lalande,
P. Canet,
Rachid Bouchakour,
F. Jeuland,
B. Bertello,
B. Villard:
Extraction of 3D parasitic capacitances in 90 nm and 22 nm NAND flash memories.
Microelectronics Reliability 49(9-11): 1056-1059 (2009) |
| 6 |  | J. Postel-Pellerin,
F. Lalande,
P. Canet,
Rachid Bouchakour,
F. Jeuland,
L. Morancho:
Modeling charge variation during data retention of MLC Flash memories.
Microelectronics Reliability 49(9-11): 1060-1063 (2009) |
| 2006 |
| 5 |  | B. Saillet,
A. Regnier,
Jean Michel Portal,
B. Delsuc,
R. Laffont,
Pascal Masson,
Rachid Bouchakour:
MM11 based flash memory cell model including characterization procedure.
ISCAS 2006 |
| 2005 |
| 4 |  | Fabien Gilibert,
Denis Rideau,
Alexandre Dray,
Francois Agut,
Michel Minondo,
Andre Juge,
Pascal Masson,
Rachid Bouchakour:
Characterization and Modeling of Gate-Induced-Drain-Leakage.
IEICE Transactions 88-C(5): 829-837 (2005) |
| 2002 |
| 3 |  | R. Laffont,
J. Razafindramora,
P. Canet,
Rachid Bouchakour,
J. M. Mirabel:
Decreasing EEPROM Programming Bias With Negative Voltage, Reliability Impact.
MTDT 2002: 168-176 |
| 2001 |
| 2 |  | Rachid Bouchakour,
N. Harabech,
P. Canet,
Ph. Boivin,
J. M. Mirabel:
Modeling of a floating-gate EEPROM cell using a charge sheet approach including variable tunneling capacitance and polysilicon gate depletion effect.
ISCAS (4) 2001: 822-825 |
| 1 |  | P. Canet,
Rachid Bouchakour,
N. Harabech,
Ph. Boivin,
J. M. Mirabel:
EEPROM programming study-time and degradation aspects.
ISCAS (4) 2001: 846-849 |