R. Bottini

	2007
4		R. Bottini, S. Costantini, N. Galbiati, A. Ghetti, G. Ghidini, A. Mauri, C. Scozzari, A. Sebastiani: High voltage transistor degradation in NVM pump application. Microelectronics Reliability 47(9-11): 1384-1388 (2007)
	2005
3		G. Ghidini, M. Langenbuch, R. Bottini, D. Brazzelli, A. Ghetti, N. Galbiati, G. Giusto, A. Garavaglia: Impact of interface and bulk trapped charges on transistor reliability. Microelectronics Reliability 45(5-6): 857-860 (2005)
2		M. Langenbuch, R. Bottini, M. E. Vitali, G. Ghidini: In situ steam generation (ISSG) versus standard steam technology: impact on oxide reliability. Microelectronics Reliability 45(5-6): 875-878 (2005)
	2003
1		G. Ghidini, A. Garavaglia, G. Giusto, A. Ghetti, R. Bottini, D. Peschiaroli, M. Scaravaggi, F. Cazzaniga, D. Ielmini: Impact of gate stack process on conduction and reliability of 0.18 mum PMOSFET. Microelectronics Reliability 43(8): 1221-1227 (2003)

Coauthor Index

1	D. Brazzelli	[3]
2	F. Cazzaniga	[1]
3	S. Costantini	[4]
4	N. Galbiati	[3] [4]
5	A. Garavaglia	[1] [3]
6	A. Ghetti	[1] [3] [4]
7	G. Ghidini	[1] [2] [3] [4]
8	G. Giusto	[1] [3]
9	D. Ielmini	[1]
10	M. Langenbuch	[2] [3]
11	A. Mauri	[4]
12	D. Peschiaroli	[1]
13	M. Scaravaggi	[1]
14	C. Scozzari	[4]
15	A. Sebastiani	[4]
16	M. E. Vitali	[2]

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