 | 2011 |
| 28 |  | Salvador Barcelo,
X. Gili,
Sebastiàn A. Bota,
Jaume Segura:
An efficient and scalable STA tool with direct path estimation and exhaustive sensitization vector exploration for optimal delay computation.
DATE 2011: 1602-1607 |
| 27 |  | Bartomeu Alorda,
Gabriel Torrens,
Sebastiàn A. Bota,
Jaume Segura:
Stability optimization of embedded 8T SRAMs using Word-Line Voltage modulation.
DATE 2011: 986-991 |
| 26 |  | Bartomeu Alorda,
Gabriel Torrens,
Sebastiàn A. Bota,
Jaume Segura:
8T vs. 6T SRAM cell radiation robustness: A comparative analysis.
Microelectronics Reliability 51(2): 350-359 (2011) |
| 2010 |
| 25 |  | Bartomeu Alorda,
Gabriel Torrens,
Sebastiàn A. Bota,
Jaume Segura:
Static and dynamic stability improvement strategies for 6T CMOS low-power SRAMs.
DATE 2010: 429-434 |
| 24 |  | Sebastiàn A. Bota,
Gabriel Torrens,
Bartomeu Alorda,
J. Verd,
Jaume Segura:
Cross-BIC architecture for single and multiple SEU detection enhancement in SRAM memories.
IOLTS 2010: 141-146 |
| 23 |  | Kay Suenaga,
Eugeni Isern,
Rodrigo Picos,
Sebastiàn A. Bota,
Miquel Roca,
Eugeni García-Moreno:
Application of Predictive Oscillation-Based Test to a CMOS OpAmp.
IEEE T. Instrumentation and Measurement 59(8): 2076-2082 (2010) |
| 22 |  | Gabriel Torrens,
Bartomeu Alorda,
Salvador Barcelo,
José Luis Rosselló,
Sebastiàn A. Bota,
Jaume Segura:
Design Hardening of Nanometer SRAMs Through Transistor Width Modulation and Multi-Vt Combination.
IEEE Trans. on Circuits and Systems 57-II(4): 280-284 (2010) |
| 2009 |
| 21 |  | Sebastiàn A. Bota,
Gabriel Torrens,
Bartomeu Alorda:
Critical charge characterization in 6-T SRAMs during read mode.
IOLTS 2009: 120-125 |
| 20 |  | Kay Suenaga,
Sebastiàn A. Bota,
Rodrigo Picos,
Eugeni Isern,
Miquel Roca,
Eugeni García-Moreno:
Predictive Test Technique for Diagnosis of RF CMOS Receivers.
VTS 2009: 129-133 |
| 19 |  | Eugeni García-Moreno,
Kay Suenaga,
Rodrigo Picos,
Sebastiàn A. Bota,
Miquel Roca,
Eugeni Isern:
Predictive test strategy for CMOS RF mixers.
Integration 42(1): 95-102 (2009) |
| 2007 |
| 18 |  | José Luis Rosselló,
Carol de Benito,
Sebastiàn A. Bota,
Jaume Segura:
Dynamic critical resistance: a timing-based critical resistance model for statistical delay testing of nanometer ICs.
DATE 2007: 1271-1276 |
| 17 |  | X. Cano,
Sebastiàn A. Bota,
R. Graciani,
David Gascon,
A. Herms,
A. Comerma,
Jaume Segura,
Lluís Garrido:
Heavy Ion Test Results in a CMOS triple Voting Register for a High-Energy Physics Experiment.
IOLTS 2007: 183-184 |
| 16 |  | Sebastiàn A. Bota,
M. Rosales,
José Luis Rosselló,
Jaume Segura:
Smart Temperature Sensor for Thermal Testing of Cell-Based ICs
CoRR abs/0710.4733: (2007) |
| 15 |  | José Luis Rosselló,
Vicens Canals,
Sebastiàn A. Bota,
Ali Keshavarzi,
Jaume Segura:
A Fast Concurrent Power-Thermal Model for Sub-100nm Digital ICs
CoRR abs/0710.4759: (2007) |
| 14 |  | Kay Suenaga,
Rodrigo Picos,
Sebastiàn A. Bota,
Miquel Roca,
Eugeni Isern,
Eugenio García:
A Module for BiST of CMOS RF Receivers.
J. Electronic Testing 23(6): 605-612 (2007) |
| 2006 |
| 13 |  | José Luis Rosselló,
Sebastiàn A. Bota,
Vicens Canals,
Ivan de Paúl,
Jaume Segura:
A Fully CMOS Low-Cost Chaotic Neural Network.
IJCNN 2006: 659-663 |
| 12 |  | José Luis Rosselló,
Carol de Benito,
Sebastiàn A. Bota,
Jaume Segura:
Leakage Power Characterization Considering Process Variations.
PATMOS 2006: 66-74 |
| 11 |  | Sebastiàn A. Bota,
M. Rosales,
José Luis Rosselló,
Jaume Segura:
Low V_D_D vs. Delay: Is it Really a Good Correlation Metric for Nanometer ICs?.
VTS 2006: 358-363 |
| 10 |  | Sebastiàn A. Bota,
José Luis Rosselló,
Carol de Benito,
Ali Keshavarzi,
Jaume Segura:
Impact of Thermal Gradients on Clock Skew and Testing.
IEEE Design & Test of Computers 23(5): 414-424 (2006) |
| 2005 |
| 9 |  | José Luis Rosselló,
Vicens Canals,
Sebastiàn A. Bota,
Ali Keshavarzi,
Jaume Segura:
A Fast Concurrent Power-Thermal Model for Sub-100nm Digital ICs.
DATE 2005: 206-211 |
| 8 |  | Sebastiàn A. Bota,
M. Rosales,
José Luis Rosselló,
Jaume Segura:
Smart Temperature Sensor for Thermal Testing of Cell-Based ICs.
DATE 2005: 464-465 |
| 7 |  | Bartomeu Alorda,
Sebastiàn A. Bota,
Jaume Segura:
A Non-Intrusive Built-In Sensor for Transient Current Testing of Digital VLSI Circuits.
IOLTS 2005: 177-182 |
| 6 |  | José Luis Rosselló,
Sebastiàn A. Bota,
Jaume Segura:
Compact Static Power Model of Complex CMOS Gates.
PATMOS 2005: 348-354 |
| 2004 |
| 5 |  | Rodrigo Picos,
Miquel Roca,
Eugeni Isern,
Sebastiàn A. Bota,
Eugenio García:
On-line Monitoring Capabilities of Oscillation Test Techniques: Results Demonstration in an OTA.
IOLTS 2004: 179 |
| 4 |  | Raimon Casanova,
José Luis Merino,
Ángel Dieguez,
Sebastiàn A. Bota,
Josep Samitier:
A mixed-mode temperature control circuit for gas sensors.
ISCAS (4) 2004: 896-909 |
| 3 |  | Sebastiàn A. Bota,
M. Rosales,
José Luis Rosselló,
Jaume Segura,
Ali Keshavarzi:
Within Die Thermal Gradient Impact on Clock-Skew: A New Type of Delay-Fault Mechanism.
ITC 2004: 1276-1284 |
| 2 |  | José Luis Merino,
Sebastiàn A. Bota,
Raimon Casanova,
Ángel Dieguez,
Carles Cané,
Josep Samitier:
A reusable smart interface for gas sensor resistance measurement.
IEEE T. Instrumentation and Measurement 53(4): 1173-1178 (2004) |
| 2001 |
| 1 |  | José Luis Merino,
Sebastiàn A. Bota,
A. Herms,
Josep Samitier,
Enric Cabruja,
Xavier Jordà,
Miquel Vellvehí,
J. Bausells,
A. Ferré,
J. Bigorr:
Smart Temperature Sensor for On-Line Monitoring in Automotive Applications.
IOLTW 2001: 122-126 |