Alberto Bosio

	2012
52		J. Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, G. Prenat, Jérémy Alvarez-Herault, Ken Mackay: Impact of resistive-open defects on the heat current of TAS-MRAM architectures. DATE 2012: 532-537
51		Pierre-Didier Mauroux, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Benoît Godard, Gilles Festes, Laurent Vachez: Analysis and Fault Modeling of Actual Resistive Defects in ATMEL [InlineMediaObject not available: see fulltext.] eFlash Memories. J. Electronic Testing 28(2): 215-228 (2012)
	2011
50		D. A. Tran, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Hans-Joachim Wunderlich: A Hybrid Fault Tolerant Architecture for Robustness Improvement of Digital Circuits. Asian Test Symposium 2011: 136-141
49		Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Aida Todri, Arnaud Virazel, Nabil Badereddine: Failure Analysis and Test Solutions for Low-Power SRAMs. Asian Test Symposium 2011: 459-460
48		Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Kohei Miyase, X. Wen: Power-Aware Test Pattern Generation for At-Speed LOS Testing. Asian Test Symposium 2011: 506-510
47		Kohei Miyase, Y. Uchinodan, Kazunari Enokimoto, Yuta Yamato, Xiaoqing Wen, Seiji Kajihara, Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Arnaud Virazel: Effective Launch-to-Capture Power Reduction for LOS Scheme with Adjacent-Probability-Based X-Filling. Asian Test Symposium 2011: 90-95
46		Aida Todri, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel: A study of path delay variations in the presence of uncorrelated power and ground supply noise. DDECS 2011: 189-194
45		Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine: Optimized march test flow for detecting memory faults in SRAM devices under bit line coupling. DDECS 2011: 353-358
44		Pierre-Didier Mauroux, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Benoît Godard, Gilles Festes, Laurent Vachez: On using a SPICE-like TSTAC™ eFlash model for design and test. DDECS 2011: 359-364
43		Paolo Bernardi, Matteo Sonza Reorda, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch: On the Modeling of Gate Delay Faults by Means of Transition Delay Faults. DFT 2011: 226-232
42		Luigi Dilillo, Alberto Bosio, Miroslav Valka, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel: Error Resilient Infrastructure for Data Transfer in a Distributed Neutron Detector. DFT 2011: 294-301
41		Miroslav Valka, Alberto Bosio, Luigi Dilillo, Pierre Girard, Serge Pravossoudovitch, Arnaud Virazel, Ernesto Sánchez, Mauricio de Carvalho, Matteo Sonza Reorda: A Functional Power Evaluation Flow for Defining Test Power Limits during At-Speed Delay Testing. European Test Symposium 2011: 153-158
40		Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine: On using address scrambling to implement defect tolerance in SRAMs. ITC 2011: 1-8
	2010
39		Paolo Rech, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Luigi Dilillo: A Memory Fault Simulator for Radiation-Induced Effects in SRAMs. Asian Test Symposium 2010: 100-105
38		Youssef Benabboud, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Olivia Riewer: A Comprehensive System-on-Chip Logic Diagnosis. Asian Test Symposium 2010: 237-242
37		Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine: A statistical simulation method for reliability analysis of SRAM core-cells. DAC 2010: 853-856
36		Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Junxia Ma, Wei Zhao, Mohammad Tehranipoor, Xiaoqing Wen: Analysis of power consumption and transition fault coverage for LOS and LOC testing schemes. DDECS 2010: 376-381
35		Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Paolo Bernardi, Matteo Sonza Reorda: An Exact and Efficient Critical Path Tracing Algorithm. DELTA 2010: 164-169
34		Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine: Impact of Resistive-Bridging Defects in SRAM Core-Cell. DELTA 2010: 265-269
33		Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine: Analysis of resistive-bridging defects in SRAM core-cells: A comparative study from 90nm down to 40nm technology nodes. European Test Symposium 2010: 132-137
32		Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine: Setting test conditions for improving SRAM reliability. European Test Symposium 2010: 257
31		Pierre-Didier Mauroux, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Benoît Godard, Gilles Festes, Laurent Vachez: A two-layer SPICE model of the ATMEL TSTACTM eFlash memory technology for defect injection and faulty behavior prediction. European Test Symposium 2010: 81-86
30		Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Mohammad Tehranipoor, Kohei Miyase, Xiaoqing Wen, Nisar Ahmed: Is test power reduction through X-filling good enough? ITC 2010: 805
29		D. A. Tran, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Hans-Joachim Wunderlich: Parity prediction synthesis for nano-electronic gate designs. ITC 2010: 820
28		Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Pierre Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine: Detecting NBTI induced failures in SRAM core-cells. VTS 2010: 75-80
27		Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel: A Comprehensive Framework for Logic Diagnosis of Arbitrary Defects. IEEE Trans. Computers 59(3): 289-300 (2010)
26		Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Mohammad Tehranipoor, Xiaoqing Wen, Nisar Ahmed: A Comprehensive Analysis of Transition Fault Coverage and Test Power Dissipation for Launch-Off-Shift and Launch-Off-Capture Schemes. J. Low Power Electronics 6(2): 359-374 (2010)
	2009
25		Youssef Benabboud, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Olivia Riewer: Delay Fault Diagnosis in Sequential Circuits. Asian Test Symposium 2009: 355-360
24		Youssef Benabboud, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Laroussi Bouzaida, Isabelle Izaute: Comprehensive bridging fault diagnosis based on the SLAT paradigm. DDECS 2009: 264-269
23		Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Paolo Bernardi, Matteo Sonza Reorda: An efficient fault simulation technique for transition faults in non-scan sequential circuits. DDECS 2009: 50-55
22		Youssef Benabboud, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Laroussi Bouzaida, Isabelle Izaute: A case study on logic diagnosis for System-on-Chip. ISQED 2009: 253-259
21		Pierre-Didier Mauroux, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Benoît Godard: NAND flash testing: A preliminary study on actual defects. ITC 2009: 1
20		Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Paolo Prinetto: Are IEEE-1500-Compliant Cores Really Compliant to the Standard?. IEEE Design & Test of Computers 26(3): 16-24 (2009)
19		Julien Vial, Arnaud Virazel, Alberto Bosio, Patrick Girard, Christian Landrault, Serge Pravossoudovitch: Is triple modular redundancy suitable for yield improvement? IET Computers & Digital Techniques 3(6): 581-592 (2009)
	2008
18		Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Paolo Bernardi: SoC Symbolic Simulation: a case study on delay fault testing. DDECS 2008: 320-325
17		Alexandre Rousset, Alberto Bosio, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel: Improving Diagnosis Resolution without Physical Information. DELTA 2008: 210-215
16		Julien Vial, Alberto Bosio, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel: Using TMR Architectures for Yield Improvement. DFT 2008: 7-15
15		Julien Vial, Alberto Bosio, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel: Yield Improvement, Fault-Tolerance to the Rescue?. IOLTS 2008: 165-166
14		Philipp Öhler, Alberto Bosio, Giorgio Di Natale, Sybille Hellebrand: A Modular Memory BIST for Optimized Memory Repair. IOLTS 2008: 171-172
13		Julien Vial, Alberto Bosio, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel: SoC Yield Improvement: Redundant Architectures to the Rescue? ITC 2008: 1
12		Alexandre Ney, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian: A History-Based Diagnosis Technique for Static and Dynamic Faults in SRAMs. ITC 2008: 1-10
11		Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto: March Test Generation Revealed. IEEE Trans. Computers 57(12): 1704-1713 (2008)
	2007
10		Alexandre Rousset, Alberto Bosio, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel: A Mixed Approach for Unified Logic Diagnosis. DDECS 2007: 239-242
9		Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Riccardo Mariani: A Functional Verification Based Fault Injection Environment. DFT 2007: 114-122
8		Alexandre Rousset, Alberto Bosio, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel: DERRIC: A Tool for Unified Logic Diagnosis. European Test Symposium 2007: 13-20
7		Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto: March AB, a state-of-the-art march test for realistic static linked faults and dynamic faults in SRAMs. IET Computers & Digital Techniques 1(3): 237-245 (2007)
	2006
6		Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto: Automatic march tests generations for static linked faults in SRAMs. DATE 2006: 1258-1263
5		Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto: A Unique March Test Algorithm for the Wide Spread of Realistic Memory Faults in SRAMs. DDECS 2006: 157-158
4		Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto: Automatic March Tests Generation for Multi-Port SRAMs. DELTA 2006: 385-392
3		Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto: A 22n March Test for Realistic Static Linked Faults in SRAMs. European Test Symposium 2006: 49-54
2		Alberto Bosio, Giovanni Righini: A dynamic programming algorithm for the single-machine scheduling problem with deteriorating processing times. Electronic Notes in Discrete Mathematics 25: 139-142 (2006)
	2005
1		Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto: March AB, March AB1: new March tests for unlinked dynamic memory faults. ITC 2005: 8

Coauthor Index

1	Nisar Ahmed	[26] [30]
2	Jérémy Alvarez-Herault	[52]
3	J. Azevedo	[52]
4	Nabil Badereddine	[28] [32] [33] [34] [37] [40] [45] [49]
5	Magali Bastian (Magali Bastian Hage-Hassan)	[12]
6	Youssef Benabboud	[22] [24] [25] [38]
7	Alfredo Benso	[1] [3] [4] [5] [6] [9] [11] [20]
8	Paolo Bernardi	[18] [23] [35] [43]
9	Laroussi Bouzaida	[22] [24]
10	Stefano Di Carlo	[1] [3] [4] [5] [6] [7] [9] [11] [20]
11	Mauricio de Carvalho	[41]
12	Luigi Dilillo	[12] [21] [24] [25] [26] [28] [29] [30] [31] [32] [33] [34] [36] [37] [38] [39] [40] [41] [42] [44] [45] [46] [47] [48] [49] [50] [51] [52]
13	Kazunari Enokimoto	[47]
14	Gilles Festes	[31] [44] [51]
15	Renan Alves Fonseca	[28] [32] [33] [34] [37] [40]
16	Patrick Girard	[8] [10] [12] [13] [15] [16] [17] [18] [19] [21] [22] [23] [24] [25] [26] [27] [29] [30] [31] [32] [33] [34] [35] [36] [37] [38] [39] [40] [42] [43] [44] [45] [46] [47] [48] [49] [50] [51] [52]
17	Pierre Girard	[28] [41]
18	Benoît Godard	[21] [31] [44] [51]
19	Sybille Hellebrand	[14]
20	Isabelle Izaute	[22] [24]
21	Seiji Kajihara	[47]
22	Christian Landrault	[8] [10] [13] [15] [16] [17] [19]
23	Junxia Ma	[36]
24	Ken Mackay	[52]
25	Riccardo Mariani	[9]
26	Pierre-Didier Mauroux	[21] [31] [44] [51]
27	Kohei Miyase	[30] [47] [48]
28	Giorgio Di Natale	[1] [3] [4] [5] [6] [7] [11] [14]
29	Alexandre Ney	[12]
30	Philipp Öhler	[14]
31	Serge Pravossoudovitch	[8] [10] [12] [13] [15] [16] [17] [18] [19] [21] [22] [23] [24] [25] [26] [27] [28] [29] [30] [31] [32] [33] [34] [35] [36] [37] [38] [39] [40] [41] [42] [43] [44] [45] [46] [49] [50] [51]
32	G. Prenat	[52]
33	Paolo Prinetto	[1] [3] [4] [5] [6] [7] [11] [20]
34	Paolo Rech	[39]
35	Matteo Sonza Reorda	[23] [35] [41] [43]
36	Olivia Riewer	[25] [38]
37	Giovanni Righini	[2]
38	Alexandre Rousset	[8] [10] [17]
39	Ernesto Sánchez (Edgar E. Sánchez, Edgar Ernesto Sánchez Sánchez)	[41]
40	Mohammad Tehranipoor	[26] [30] [36]
41	Aida Todri (Aida Todri-Sanial)	[46] [48] [49] [52]
42	D. A. Tran	[29] [50]
43	Y. Uchinodan	[47]
44	Laurent Vachez	[31] [44] [51]
45	Miroslav Valka	[41] [42]
46	Julien Vial	[13] [15] [16] [19]
47	Arnaud Virazel	[8] [10] [12] [13] [15] [16] [17] [19] [21] [22] [24] [25] [26] [27] [28] [29] [30] [31] [32] [33] [34] [36] [37] [38] [39] [40] [41] [42] [44] [45] [46] [47] [48] [49] [50] [51] [52]
48	X. Wen	[48]
49	Xiaoqing Wen	[26] [30] [36] [47]
50	Fangmei Wu	[26] [30] [36] [47]
51	Hans-Joachim Wunderlich	[29] [50]
52	Yuta Yamato	[47]
53	Wei Zhao	[36]
54	Leonardo Bonet Zordan	[45] [49]

Colors in the list of coauthors

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