Gianluca Boselli

	2006
3		Charvaka Duvvury, Robert Steinhoff, Gianluca Boselli, Vijay Reddy, Hans Kunz, Steve Marum, Roger Cline: Gate oxide failures due to anomalous stress from HBM ESD testers. Microelectronics Reliability 46(5-6): 656-665 (2006)
	2005
2		Jeremy C. Smith, Gianluca Boselli: A MOSFET power supply clamp with feedback enhanced triggering for ESD protection in advanced CMOS technologies. Microelectronics Reliability 45(2): 201-210 (2005)
	2001
1		Gianluca Boselli, Stan Meeuwsen, Ton J. Mouthaan, Fred G. Kuper: Investigations on double-diffused MOS transistors under ESD zap conditions. Microelectronics Reliability 41(3): 395-405 (2001)

Coauthor Index

1	Roger Cline	[3]
2	Charvaka Duvvury	[3]
3	Hans Kunz	[3]
4	Fred G. Kuper	[1]
5	Steve Marum	[3]
6	Stan Meeuwsen	[1]
7	Ton J. Mouthaan	[1]
8	Vijay Reddy	[3]
9	Jeremy C. Smith	[2]
10	Robert Steinhoff	[3]

Colors in the list of coauthors

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