G. Boselli

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2005

1 G. Boselli, C. Duvvury: Trends and challenges to ESD and Latch-up designs for nanometer CMOS technologies. Microelectronics Reliability 45(9-11): 1406-1414 (2005)

	2005
1		G. Boselli, C. Duvvury: Trends and challenges to ESD and Latch-up designs for nanometer CMOS technologies. Microelectronics Reliability 45(9-11): 1406-1414 (2005)

Coauthor Index

1 C. Duvvury [1]

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