A. van den Bos

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2002

3 Sandra Van Aert, Arnold Jan den Dekker, A. van den Bos, Dirk Van Dyck: High-resolution electron microscopy: from imaging toward measuring. IEEE T. Instrumentation and Measurement 51(4): 611-615 (2002)

1999

2 A. van den Bos: Nonlinear statistical signal processing: Useful theorems and their application. NSIP 1999: 603-606

1988

1 A. van den Bos: Nonlinear least-absolute-values and minimax model fitting. Automatica 24(6): 803-808 (1988)

	2002
3		Sandra Van Aert, Arnold Jan den Dekker, A. van den Bos, Dirk Van Dyck: High-resolution electron microscopy: from imaging toward measuring. IEEE T. Instrumentation and Measurement 51(4): 611-615 (2002)
	1999
2		A. van den Bos: Nonlinear statistical signal processing: Useful theorems and their application. NSIP 1999: 603-606
	1988
1		A. van den Bos: Nonlinear least-absolute-values and minimax model fitting. Automatica 24(6): 803-808 (1988)

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