 | 2010 |
| 3 |  | Simone Gerardin,
M. Bagatin,
Alessandro Paccagnella,
G. Cellere,
A. Visconti,
M. Bonanomi:
Impact of total dose on heavy-ion upsets in floating gate arrays.
Microelectronics Reliability 50(9-11): 1837-1841 (2010) |
| 2006 |
| 2 |  | G. Cellere,
Alessandro Paccagnella,
A. Visconti,
M. Bonanomi:
Erratic Effects of Irradiation in Floating Gate Memory Cells.
IOLTS 2006: 51-56 |
| 2005 |
| 1 |  | G. Cellere,
Alessandro Paccagnella,
A. Visconti,
M. Bonanomi:
Soft Errors induced by single heavy ions in Floating Gate memory arrays.
DFT 2005: 275-284 |