P. Boivin

	2009
4		L. France, N. Ouillon, G. Chazot, J. Kornprobst, P. Boivin: CMAS 3D, a new program to visualize and project major elements compositions in the CMAS system. Computers & Geosciences 35(6): 1304-1310 (2009)
	2007
3		Nicolas Baboux, C. Busseret, C. Plossu, P. Boivin: Peculiarities of electron tunnel injection to the drain of EEPROMs. Microelectronics Reliability 47(4-5): 631-634 (2007)
	2005
2		D. Goguenheim, A. Bravaix, S. Gomri, J. M. Moragues, C. Monserie, N. Legrand, P. Boivin: Impact of wafer charging on hot carrier reliability and optimization of latent damage detection methodology in advanced CMOS technologies. Microelectronics Reliability 45(3-4): 487-492 (2005)
1		Nicolas Baboux, C. Plossu, P. Boivin: Dynamic Fowler-Nordheim injection in EEPROM tunnel oxides at realistic time scales. Microelectronics Reliability 45(5-6): 911-914 (2005)

Coauthor Index

1	Nicolas Baboux	[1] [3]
2	A. Bravaix	[2]
3	C. Busseret	[3]
4	G. Chazot	[4]
5	L. France	[4]
6	Didier Goguenheim (D. Goguenheim)	[2]
7	S. Gomri	[2]
8	J. Kornprobst	[4]
9	N. Legrand	[2]
10	C. Monserie	[2]
11	J. M. Moragues	[2]
12	N. Ouillon	[4]
13	C. Plossu	[1] [3]

Colors in the list of coauthors

Last update Sun May 27 04:04:01 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page