S. Bohidar

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2003

1 Hui-Yuan Song, S. Bohidar, R. Iris Bahar, Joel Grodstein: Symbolic Failure Analysis of Custom Circuits due to Excessive Leakage Current. ICCD 2003: 70-75

	2003
1		Hui-Yuan Song, S. Bohidar, R. Iris Bahar, Joel Grodstein: Symbolic Failure Analysis of Custom Circuits due to Excessive Leakage Current. ICCD 2003: 70-75

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