Daniel Bockelman

	2000
1		W. Robert Daasch, James McNames, Daniel Bockelman, Kevin Cota: Variance reduction using wafer patterns in I_ddQ data. ITC 2000: 189-198

Coauthor Index

1	Kevin Cota	[1]
2	W. Robert Daasch	[1]
3	James McNames	[1]

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