S. Blonkowski

	2005
3		E. Deloffre, L. Montès, G. Ghibaudo, S. Bruyère, S. Blonkowski, S. Bécu, M. Gros-Jean, S. Crémer: Electrical properties in low temperature range (5K-300K) of Tantalum Oxide dielectric MIM capacitors. Microelectronics Reliability 45(5-6): 925-928 (2005)
	2003
2		C. Besset, S. Bruyère, S. Blonkowski, S. Crémer, E. Vincent: MIM capacitance variation under electrical stress. Microelectronics Reliability 43(8): 1237-1240 (2003)
1		F. Mondon, S. Blonkowski: Electrical characterisation and reliability of HfO2 and Al2O3-HfO2 MIM capacitors. Microelectronics Reliability 43(8): 1259-1266 (2003)

Coauthor Index

1	S. Bécu	[3]
2	C. Besset	[2]
3	S. Bruyère	[2] [3]
4	S. Crémer	[2] [3]
5	E. Deloffre	[3]
6	Gérard Ghibaudo (G. Ghibaudo)	[3]
7	M. Gros-Jean	[3]
8	F. Mondon	[1]
9	L. Montès	[3]
10	E. Vincent	[2]

Colors in the list of coauthors

Last update Sun May 27 04:04:01 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page